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Wjatscheslaw Galjan, Desislava Naydenova, Jakob M. Tomasik, Dietmar Schroeder and Wolfgang H. Krautschneider
A Portable SoC-based ECG-System for 24h x 7d Operating Time
In Tagungsband "IEEE BioCAS", 2008, p. 85-88
Baltimore, USA, 20.-22. Nov. 2008
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Jakob M. Tomasik, Kristian M. Hafkemeyer, Wjatscheslaw Galjan, Dietmar Schroeder, and Wolfgang H. Krautschneider
A 130nm CMOS Programmable Operational Amplifier
In Tagungsband "NORCHIP 2008", 2008
Tallinn, Estonia, 17.-18. Nov. 2008
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Nashwa Abo Elneel, Erkan Aksoy, and Dietmar Schroeder
A Power-Adaptable Entropy-Coding A/D Converter
In Tagungsband "NORCHIP 2008", 2008
Tallinn, Estonia, 17.-18. Nov. 2008
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Kristian M. Hafkemeyer, Arthur Schott, Paola Vega-Castillo, and Wolfgang H. Krautschneider
Analog Circuit Calibration with Single Poly Non-Volatile Memories
In Tagungsband "NORCHIP 2008", 2008
Tallinn, Estonia, 17.-18. Nov. 2008
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Harish Balasubramaniam, Wjatscheslaw Galjan and Wolfgang H. Krautschneider
A Configurable Multi-Mode Dual Slope ADC in 130nm CMOS for Biomedical Signal Acquisition
In Tagungsband "ProRISC2008 Workshop", 2008
ProRISC 2008
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Lait Abu-Saleh, Jakob M. Tomasik, Wjatscheslaw Galjan, Wolfgang H. Krautschneider
A SoC Based Mobile EEG Signal Acquisition System Using Multi-Sensor-Recording to Reduce Noise and Artifacts
In Tagungsband "ProRISC2008 Workshop", 2008, p. 291-294
Veldhoven, The Netherlands, 27.-28. Nov. 2008
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Nashwa Abo Elneel, Fabian Wagner, Dietmar Schroeder, and Wolfgang H. Krautschneider
An Approach for an Efficient Transition from System-on-Chip to System-in-Package
In Tagungsband "SAFE2008 Workshop", 2008
SAFE2008
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Müller, Claas and Erdler, Gilbert and Kuhl, Matthias and Manoli, Yiannos and GmbH, Micronas
Electric voltage supply
oct 2008
EP Patent App. 20,080,018,466
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C. Ucurum, H. Goebel, F.A. Yildirim, W. Bauhofer, and W. Krautschneider
Hole trap related hysteresis in pentacene field-effect transistors
Artikel in "Journal of Applied Physics", vol. 104, p. 84501, 2008
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Sebastian Georgi, Christoph Weyer, Martin Stemick, Christian Renner, Felix Hackbarth, Ulf Pilz, Jens Eichmann, Tobias Pilsak, Harald Sauff, Luis Torres, Klaus Dembowski, Fabian Wagner
SomSeD: An Interdisciplinary Approach for Developing Wireless Sensor Networks
In Tagungsband "7. GI/ITG KuVS Fachgespräch Drahtlose Sensornetze", 2008
Berlin, 25.-26. September 2008
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Ronald M. Meixner and Holger H. Göbel and Haidi Qiu and Cihan Ucurum and Wilfried Klix and Roland Stenzel and Faruk Altan Yildirim and Wolfgang Bauhofer and Wolfgang H. Krautschneider
A Physical-Based PSPICE Compact Model for Poly(3-hexylthiophene) Organic Field-Effect Transistors
Artikel in "IEEE Transactions on Electron Devices", vol. 55, Nr. 7, p. 1776-1781, 2008
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A. Avellán and S. Jakschik and B. Tippelt and S. Kudelka and W. Krautschneider
Post Hard Breakdown Conduction in MOS Capacitors With Silicon and Aluminum Oxide as Dielectric
Artikel in "IEEE Electron Device Letters", vol. 29, Nr. 4, p. 366-368, 2008
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N. Van Helleputte, J.M. Tomasik, W. Galjan, A. Mora-Sanchez, D. Schroeder, W.H. Krautschneider, R. Puers
A flexible system-on-chip (SoC) for biomedical signal acquisition and processing
Artikel in "Sensors and Actuators A: Physical", vol. 142, p. 361-368, 2008
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F. Wagner and Ch. Jakobi and J. Tomasik and K. Hafkemeyer and W. Galjan and D. Schroeder and W. Krautschneider
Design and Implementation of an Automated Test Environment for Signal-Acquisition ASICs
Artikel in "SCD Dresden", 2008
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F. A. Yildrim, R. R. Schliewe, W. Bauhofer, R. M. Meixner, H. Goebel, W. Krautschneider
Gate insulators and interface effects in organic thin-film transistors
Artikel in "Elsevier ScienceDirect Organic Electronics", vol. 9, 2008
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A. Domdey, K.M. Hafkemeyer, W.H. Krautschneider, and D. Schroeder
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
In Tagungsband "Advances in Radio Science", 2008, p. 205-207
Kleinheubacher Berichte
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Gieschke, P and Nurcahyo, Y and Herrmann, M and Kuhl, M and Ruther, P and Paul, O
Integrated stress mapping chip with 32 piezoresistive field effect transistors
In Tagungsband "Proc. Eurosensors XXII", 2008, p. 292--295